Inductively coupled plasma optical emission spectroscopy (ICP-OES) is a commonly used technique for the determination of trace elements in metallurgical matrices due to its ability to handle high levels of dissolved solids without the need for special sample introduction components or matrix separation schemes. However, the analysis of trace metals in metallurgical matrices also presents a challenge for ICP-OES – spectral interferences – as many elements have a large number of emission lines, which increases the potential for spectral interferences.
This work demonstrates how spectral interferences can be resolved using Multicomponent Spectral Fitting (MSF) with the Avio® 550 Max fully simultaneous ICP-OES while analyzing metallurgical samples.